letid

The devices behind light-elevated temperature-induced deterioration are still not completely comprehended, yet it is known to cause considerable efficiency losses for modules in the field. Researchers in China are investigating the causes of the sensation, as well as are currently concentrated on the surface area of the materials and the user interfaces in between the silicon and passivation layers.

Scientists at Germany's Fraunhofer Institute for Integrated Solutions and Device Modern technology IISB are attempting to recognize the sources of light and elevated temperature induced degradation (LeTID) in PERC solar cells. First examinations must offer a comprehensive understanding of the process and also product dependence of LeTID and also associated degradation effects in monocrystalline and multicrystalline PERC solar cells.

PV Evolution Labs (PVEL) is including a number of key module reliability tests to its PV Module Product Qualification Program (PQP) that is more responsive to downstream market needs.